Que ce soit à travers l'agence Toulouse, l'agence Rhône-Alpes ou l'agence Ile-de-France, NEXIO organise et participe à des évènements tout au long de l'année autour de différents thèmes.

A one week Training in Electromagnetic Compatibilit y of Integrated Circuits

 lundi 22 septembre 2014 vendredi 26 septembre 2014Evènements


Description of the Course Topic

This five-day course is focused on electromagnetic compatibility of integrated circuits. A set of basic concepts is proposed as an introduction, covering specific units, parasitic impedance of interconnects, origin of noise, noise margins, time/frequency conversion and 50 W adaptations. The second focus concerns parasitic emission, how to design low emission circuits and how to measure the IC emission using standard IEC 61967 methods. A third topic concerns susceptibility, with focus on measurement methods (IEC 62132) and hardware/software techniques to improve immunity to interference. The fourth part is related to modeling approaches for predicting EMC (IEC 62433), based on standards such as IBIS, ICEM and ICIM. The fifth part deals with EMC guidelines for improved emission and immunity to interference.Illustrations of these concepts are  made using IC-EMC (www.ic-emc.org), a freeware including unique features and tools for efficient EMC simulations of integrated circuits.

Afternoons are dedicated to practical sessions including an access to the EMC laboratory of INSA Toulouse, for hands-on experiments of IC emission characterization (according to IEC 61967) and IC immunity characterization (IEC 62 132).

PhD Students in electronics and IC design, IC users, IC designers, Researchers in CMOS

Provisional detailed program

Date Morning Afternoon
Day 1

Basic concepts
Illustration of basic concepts using IC- EM
Day 2

Measurement methods
Specific setups
• Emission IEC 61 967
• Immunity IEC 62 132
Modelling Emission of ICs
• Ibis (mC buffer, mem load)
• IA (mC, IOs)
• PDN (mC)
Day 3

• Group 1 : lab - emission
measurement methods (1 ohm,
Sig int, sniffer, TEM)
• Group 2 : simulation of
emission measurement
methods (1 ohm, Sig int, TEM,
Group 2: lab – emission measurement
Group 1: simulation of emission
measurement methods

Day 4

Modelling Immunity of ICs
• IB
Group 1: lab – immunity measurement
Group 2: simulation of immunity

Day 5

• Group 2 : lab - immunity
measurement metods (uC IO)
• Group 1 : simulation of
EMC guidelines, case study; Course
evaluation and details on written exam
report evaluation criteria.

Plus d'infos et inscription





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