20 Years of Collaborative Innovation: Near-Field Measurements, from Exploration to Artificial Intelligence
Near-Field Measurements: From Exploration to Artificial Intelligence To mark the 20th anniversary of our collaborative innovation projects, we’re bringing you a series of articles chronicling NEXIO’s major technological adventures. First installment: near-field measurements, a topic that perfectly illustrates our approach—from exploratory research to the BAT-Scanner industrial product, and already geared toward artificial intelligence. Near-field scanning









