Metrology software for EMC equipment

Ensure the performance of your amplifiers

  • Improved product quality: Ensures that amplifiers perform to specification, reduces defects and increases customer satisfaction.

  • Performance optimization: Identifies and corrects inefficiencies to maximize amplifier performance.

  • Cost reduction: Minimize product returns and repairs thanks to improved quality right from the design phase.

  • Innovation: Encourage the development of new technologies by providing accurate and reliable measurements for research and development.

Our tool is designed to measure RF amplifier parameters and compare them with the manufacturer’s specifications.
Here’s what you can measure:

  • Output and saturation power
  • Gain
  • Compression power at XdB
  • Harmonics at XdB compression or rated power

X represents the compression level

Measurements are then compared with the limits (upper and lower) of the manufacturer’s specifications.
Uncertainties, all defined in BAT-EMC, can also be calculated.

Amplifier

Amplifier calibration is essential to ensure that amplifiers operate to original specifications.
Our solution is designed for EMC laboratory professionals, including engineers, technicians and researchers, to ensure that their equipment is always at peak performance.

Who is the software for?

Users

  • Design and test engineers: Need to validate amplifier performance during system design and integration.
  • Research and development laboratories: Need precise measurements for innovation and improvement of existing technologies.
  • Maintenance technicians: need to diagnose and solve amplifier performance problems.

Amplifier metrology is needed in all sectors: aerospace, military, automotive and accreditation laboratories.

Sectors concerned

This software is applicable to a variety of industries:

  • Aerospace
  • Military
  • Automotive
  • Accreditation laboratories

Webinar: Automating your metrology with a network analyzer or generator and meter

During this presentation, @Vincent Helbert presented various points:

  • Presentation of a verification method for RSIL, CDN
  • BAT-EMC interface linked to measurement method
  • Definition of measurement limits and uncertainties
  • Solution for CDN verification measurements
  • Demonstration of measurement with CDN and/or cable
  • Automatic generation of metrology reports
  • Presentation of amplifier verification measurements (gain, dB compression, harmonics, saturation)
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