NEXIO is pleased to announce its participation in the Journées d’études sur la Compatibilité Radioélectrique (CRE) at INSA Rennes, in the Amphi M’Hamed Drissi.
This event brings together industry experts and professionals, offering an ideal platform for exchanging ideas and innovations on crucial topics related to electromagnetic compatibility.

On this occasion, we are delighted to present our latest technological innovation: the BAT SCANNER.
This cutting-edge tool is specially designed to assist engineers in the design of electronic circuits.
Thanks to its advanced features, the #BAT_SCANNER accurately assesses circuit behavior, enabling emission problems to be quickly identified.

We look forward to sharing our research and exchanging ideas with other professionals on radio compatibility challenges and solutions.
Your presence at this event is an ideal opportunity to discover how BAT SCANNER can transform your electronics design processes.